Semiconductor Parameter Analyzer
Preowned Instrument

-High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1µV to 200 V
-Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
-Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
-Time-domain measurement: 60µs–variable intervals, up to 10,001 points
-Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
-Automation: built-in HP Instrument BASIC, trigger I/O capability

The Agilent 4156B is a precision semiconductor parameter analyzers designed for the most demanding challenges. A superior digital sweep parameter analyzer plus a reliability tester, powerful failure-analysis tool, and automated incoming inspection station, all rolled into a single instrument. This family was explicitly designed to provide unprecedented accuracy and functionality for evaluating your sub-micron geometry devices. With one flexible instrument, you can improve your semi-conductor quality starting from material evaluation and device characterization all the way through final packaged part inspection and field failure analysis. Agilent's 4156B has four highly accurate source/monitor units, two voltage source units, and two voltage measurement units. It is designed for Kelvin connections and has high-resolution SMUs, so it is especially suited for low resistance and low current measurements.

Axiom Sale Price-
$35,995
MSRP-$47,000

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Possible Subs:
HP /Agilent 4155B
HP /Agilent 4145B
HP /Agilent 4142B
Keithley 2400
Keithley 238
Keithley 236